NDIA’s 2010 Biometrics Conference, January 20-21, 2010 in Arlington, VA, will discuss practical approaches to President Obama’s challenges to “find the needle in the Federal haystack.” Key members of the Federal government’s policy, screening, privacy, technology & standards, international and private sectors will discuss how to connect the dots: screen and identify possible threats with a higher level of accuracy and efficiency. Presenters are from the White House, DHS, DOJ, DOD, NYPD, as well as Mexico, Australia, Canada, and Pakistan.
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